Retraction
3-D Warpage Measurement of Silicon Wafer
Paper Information
Record ID:
15351
Author(s):
Journal:
Publication Date:
August 08, 2011
Retraction Date:
September 06, 2011
(14.2 years years ago)
Subjects:
Institutions:
Country:
🇨🇳 ChinaArticle Type:
Publisher:
IEEE: Institute of Electrical and Electronics Engineers
Open Access:
Yes
PubMed ID:
Not indexed in PubMed
Retraction PubMed ID:
Not indexed in PubMed
Retraction Details
Citations (1)
1
Total Citations1
Post-Retraction(100.0%)
0
Pre-Retraction0
Same DayPost-Retraction Citation Analysis
0
Within 30 days
0
Within 1 year
0
After 2+ years
573
Days since retraction (latest)
Paper citing 3-D Warpage Measurement of Silicon Wafer...
Unknown Authors
Unknown Journal
Published: Apr 2013
573 days after retraction
Quick Stats
Total Citations:
1
Years Since Retraction:
14.2 years
Open Access:
Yes
Last Checked:
Never