Retraction
Near-Field Shielding Performances of Absorbing Materials for Integrated Circuits (IC) Applications. Part II: Crossing Excitation
Paper Information
Record ID:
19528
Author(s):
Journal:
Publication Date:
August 01, 2017
Retraction Date:
February 01, 2018
(7.8 years years ago)
Subject:
Broad Categories:
Engineering
Engineering
Specific Fields:
Engineering - Electrical
Engineering - Electrical
Institutions:
- UAq EMC Laboratory, Department of Industrial and Information Engineering and Economics, University of L'Aquila, L'Aquila, Italy
- IBM Systems Group, Research Triangle Park, Durham, NC, USA
- LAIRD Technologies, Manchester, NH, USA
- IBM Systems Group, Research Triangle Park, Durham, NC, USA
- Department of Electrical and Electronics Engineering, Missouri University of Science and Technology, Rolla, MO, USA
Countries:
Article Type:
Publisher:
IEEE: Institute of Electrical and Electronics Engineers
Open Access:
Yes
PubMed ID:
Not indexed in PubMed
Retraction PubMed ID:
Not indexed in PubMed
Retraction Details
Retraction Reason:
Nature of Retraction:
Retraction
Retraction Notice:
10.1109/TEMC.2017.2731794Additional Notes:
see also: https://www.ieee.org/about/news/2018/retractions-from-ieee-transactions-on-electromagnetic-compatibility.html;
Citations (3)
3
Total Citations3
Post-Retraction(100.0%)
0
Pre-Retraction0
Same DayPost-Retraction Citation Analysis
0
Within 30 days
0
Within 1 year
2
After 2+ years
1573
Days since retraction (latest)
Paper citing Near-Field Shielding Performances of Absorbing Mat...
Unknown Authors
Unknown Journal
Published: May 2022
1573 days after retraction
Paper citing Near-Field Shielding Performances of Absorbing Mat...
Unknown Authors
Unknown Journal
Published: Mar 2020
759 days after retraction
Paper citing Near Field Shielding Performances of Absorbing Mat...
Unknown Authors
Unknown Journal
Published: Apr 2019
424 days after retraction
Quick Stats
Total Citations:
3
Years Since Retraction:
7.8 years
Open Access:
Yes
Last Checked:
Never