Retraction
Defects Identification in a TSV Daisy-Chain Structure by a Machine Learning Approach
Paper Information
Record ID:
19537
Author(s):
Journal:
Publication Date:
January 10, 2018
Retraction Date:
November 20, 2018
(7.0 years years ago)
Subject:
Broad Categories:
Engineering
Engineering
Specific Fields:
Engineering - Electrical
Engineering - Electrical
Country:
🇮🇹 ItalyArticle Type:
Publisher:
IEEE: Institute of Electrical and Electronics Engineers
Open Access:
Yes
PubMed ID:
Not indexed in PubMed
Retraction PubMed ID:
Not indexed in PubMed
Retraction Details
Retraction Reason:
Nature of Retraction:
Retraction
Retraction Notice:
10.1109/TEMC.2017.2787769Additional Notes:
see also: https://www.ieee.org/about/news/2018/retractions-from-ieee-transactions-on-electromagnetic-compatibility.html;
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Quick Stats
Total Citations:
0
Years Since Retraction:
7.0 years
Open Access:
Yes
Last Checked:
Never