Retraction
A saboteur and mutant based built-in self-test and counting threshold-based built-in self repairing mechanism for memories
Paper Information
Record ID:
38367
Author(s):
Publication Date:
July 06, 2020
Retraction Date:
July 04, 2022
(3.4 years years ago)
Subject:
Broad Categories:
Computer Science
Computer Science
Specific Fields:
Computer Science
Computer Science
Institution:
Department of ECE, Kalasalingam Academy of Research and Education, Krishnankoil, Tamilnadu, IndiaCountry:
🇮🇳 IndiaArticle Type:
Publisher:
Springer
Open Access:
Yes
PubMed ID:
Not indexed in PubMed
Retraction PubMed ID:
Not indexed in PubMed
Retraction Details
Citations (3)
3
Total Citations2
Post-Retraction(66.7%)
0
Pre-Retraction0
Same DayPost-Retraction Citation Analysis
0
Within 30 days
2
Within 1 year
0
After 2+ years
150
Days since retraction (latest)
Heavy Metals Removal Using Carbon Based Nanocomposites
Unknown Authors
Unknown Journal
Published: Unknown
Design of Hybrid Memory Built in Self Test using Linear Feedback Shift Registers
Vasujadevi Midasala, Gajula Lakshminarayana, V. Purna Chandra Reddy et al. (6 authors)
2022 6th International Conference on Electronics, Communication and Aerospace Technology
Published: Dec 2022
3 citations
3 citations
150 days after retraction
Implementation of Power Binning-based Logic BIST Control using Activity Factor
Vinjamuri Mounika, Suman Mishra
2022 International Conference on Augmented Intelligence and Sustainable Systems (ICAISS)
Published: Nov 2022
143 days after retraction
Quick Stats
Total Citations:
4
Years Since Retraction:
3.4 years
Open Access:
Yes
Last Checked:
Jul 24, 2025