Retraction
Dark current–voltage characteristics and lock-in thermography techniques as diagnostic tools for monocrystalline silicon solar cells after thermal stress
Paper Information
Record ID:
44468
Author(s):
Journal:
Publication Date:
January 04, 2012
Retraction Date:
April 25, 2012
(13.6 years years ago)
Subjects:
Country:
🇪🇬 EgyptArticle Type:
Publisher:
Taylor and Francis
Open Access:
Yes
PubMed ID:
Not indexed in PubMed
Retraction PubMed ID:
Not indexed in PubMed
Retraction Details
Retraction Reasons:
Nature of Retraction:
Retraction
Retraction Notice:
10.1080/10589759.2012.687907Citations (2)
2
Total Citations2
Post-Retraction(100.0%)
0
Pre-Retraction0
Same DayPost-Retraction Citation Analysis
0
Within 30 days
0
Within 1 year
2
After 2+ years
2746
Days since retraction (latest)
Paper citing Dark current–voltage characteristics and lock-in t...
Unknown Authors
Unknown Journal
Published: Nov 2019
2746 days after retraction
Paper citing Dark current–voltage characteristics and lock-in t...
Unknown Authors
Unknown Journal
Published: Feb 2019
2473 days after retraction
Quick Stats
Total Citations:
2
Years Since Retraction:
13.6 years
Open Access:
Yes
Last Checked:
Never