Retraction
1/f Noise Measurements on Indium Antimonide Metal-oxide-semiconductor Field-effect Transistors
Paper Information
Record ID:
5500
Publication Date:
May 01, 1999
Retraction Date:
May 01, 2011
(14.6 years years ago)
Subjects:
Institution:
Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan, Republic of ChinaCountry:
🇹🇼 TaiwanArticle Type:
Publisher:
American Institute of Physics (AIP Publishing)
Open Access:
Yes
DOI:
PubMed ID:
Not indexed in PubMed
Retraction PubMed ID:
Not indexed in PubMed
Retraction Details
Citations (5)
5
Total Citations1
Post-Retraction(20.0%)
3
Pre-Retraction0
Same DayPost-Retraction Citation Analysis
1
Within 30 days
1
Within 1 year
0
After 2+ years
14
Days since retraction (latest)
Paper citing 1/f Noise Measurements on Indium Antimonide Metal-...
Unknown Authors
Unknown Journal
Published: Unknown
Paper citing 1/f Noise Measurements on Indium Antimonide Metal-...
Unknown Authors
Unknown Journal
Published: May 2011
14 days after retraction
Paper citing 1/f Noise Measurements on Indium Antimonide Metal-...
Unknown Authors
Unknown Journal
Published: Jun 2003
2869 days before retraction
Paper citing 1/f Noise Measurements on Indium Antimonide Metal-...
Unknown Authors
Unknown Journal
Published: Nov 2002
3103 days before retraction
Paper citing 1/f Noise Measurements on Indium Antimonide Metal-...
Unknown Authors
Unknown Journal
Published: Apr 2001
3681 days before retraction
Quick Stats
Total Citations:
5
Years Since Retraction:
14.6 years
Open Access:
Yes
Last Checked:
Never